JEOL USA introduces a new configuration of its broad ion beam milling instrument, the Cross-section Polisher (CP). The CP is widely used for preparing pristine samples prior to high resolution imaging ...
What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...
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