[Stoppi] has taken on a fascinating project involving the interference of thin layers, a phenomenon often observed in everyday life but rarely explored in such depth. This project delves into the ...
Diagram of an X-ray Reflectometry (XRR) setup: This schematic shows the arrangement of the X-ray tube, GÓ§bel mirror, sample holder, and detector. The X-rays are emitted from the tube, shaped by slits ...
Ellipsometry is a non-destructive, optical measurement technique that characterizes the optical properties of thin films. It is highly sensitive to changes in the thickness and refractive index of the ...
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