Defect inspection scientists from Huazhong University of Science and Technology, Harbin Institute of Technology and The Chinese University of Hong Kong make a thorough review of new perspectives and ...

In recent years, van der Waals crystals have evolved from scientific curiosities into a versatile platform for exploring novel quantum phases and unconventional nanophotonic phenomena. Their layered ...

Optical inspection always has been the workhorse technology for finding defects in chips. It’s fast, cost-efficient, and generally reliable enough for most chips. But as logic scales into the angstrom ...

As semiconductor devices continue advancing into more sophisticated packaging schemes, traditional optical inspection technologies are brushing up against physical and computational boundaries. The ...

Applied Materials has launched a new generation of optical semiconductor wafer inspection machines that incorporate big data and AI techniques. These multimillion-dollar machines are used in chip ...