A technical paper titled “Enhancing Test Efficiency through Automated ATPG-Aware Lightweight Scan Instrumentation” was published by researchers at University of Florida. “Scan-based ...
Today’s huge, deep submicron system on chip (SoC) designs present many challenges at every stage of development, from architectural exploration to volume production. This post addresses the specific ...
Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.
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