IEEE

Spatial Modeling with Automated Machine Learning and Gaussian Process Regression Techniques for Imputing Wafer Acceptance Test Data

Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...
HazardEx

Offshore process isolation failures present major accident hazard risk

Isolation failures are one of the main causes of hydrocarbon releases on offshore installations. These are not minor incidents – many have the potential to cause serious injury, fatalities or major ...
IEEE

Adaptive Accelerated Degradation Test Design for Tweedie Exponential Dispersion Process With Random Effects Based on the Predictive Remaining Useful Life

Abstract: The Tweedie exponential dispersion (TED) process provides a flexible framework for degradation process modeling. To obtain degradation information quickly and realistically, we focus on the ...